VLSI Test Principles and Architectures: Design for Testability
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Catégories:
Année:
2006
Edition:
1
Editeur::
Morgan Kaufmann
Langue:
english
Pages:
809
ISBN 10:
0123705975
ISBN 13:
9780123705976
Collection:
Systems on Silicon
Fichier:
PDF, 5.66 MB
IPFS:
,
english, 2006
Ce livre ne peut être téléchargé en raison d'une plainte du titulaire d'un droit